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Statistical study of the effect of process variations on nano-scale CMOS circuits with scaling
S SENGUPTA,
Published in -
2010
Abstract
In this paper, we study the effect of the variation of process parameters on the performance of a voltage controlled oscillator (VCO) and an inverter with technology scaling. The spread in performances is shown to be Gaussian in nature, considering the fact that the distributions of process parameters are also Gaussian in nature. The spreads in performances increase with technology scaling. These have been verified through HPSICE simulation results. © 2010 IEEE.
About the journal
JournalProceedings of the 2010 Annual IEEE India Conference: Green Energy, Computing and Communication, INDICON 2010
Publisher-
Open AccessNo