In this paper, we study the effect of the variation of process parameters on the performance of a voltage controlled oscillator (VCO) and an inverter with technology scaling. The spread in performances is shown to be Gaussian in nature, considering the fact that the distributions of process parameters are also Gaussian in nature. The spreads in performances increase with technology scaling. These have been verified through HPSICE simulation results. © 2010 IEEE.

SOUMYA PANDIT

Radio Physics and Electronics

S SENGUPTA

University of Calcutta (informally known as Calcutta University or CU) is a collegiate public state university located in Kolkata, West Bengal, India.&nbsp;Within India it is recognized as a &quot;Five-Star University&quot; and accredited &quot;A&quot; Grade by National Assessment and Accreditation Council.

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The University of Calcutta has secured the Fifth position among the Universities of India in the prestigious &quot;Indian University Ranking 2019&quot; list, released by the NIRF of the Ministry of Human Resource Development, Government of India.

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It was established on 24 January 1857, and was one of the first institutions in Asia to be established as a multidisciplinary and Western-style university. Its alumni and faculty include several heads of state, heads of government, social reformers, prominent artists, only academy award winner and Dirac medal winner in India, many Fellows of the Royal Society and five Nobel laureates as of 2019 which is highest in South Asia.

University Of Calcutta

Statistical study of the effect of process variations on nano-scale CMOS circuits with scaling

Proceedings of the 2010 Annual IEEE India Conference: Green Energy, Computing and Communication, INDICON 2010

CMOS

IEEE Design & Test of Computers

Modeling Process Variability in Scaled CMOS Technology

Proceedings of the IEEE

Analog Circuit Design in Nanoscale CMOS Technologies

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Design of Parasitic and Process-Variation Aware Nano-CMOS RF Circuits: A VCO Case Study

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die Variations

Journal	Proceedings of the 2010 Annual IEEE India Conference: Green Energy, Computing and Communication, INDICON 2010
Publisher	-
Open Access	No