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Nuclear Microscopy for Air-Pollutant Characterization and Its Advantages over Traditional Techniques
S S RAM, R V KUMAR, S CHANDA, S C SANTRA, M SUDARSHAN, A CHAKRABORTY,
Published in Kluwer/Plenum Publishers
2014
Volume: 81
   
Issue: 1
Pages: 145 - 150
Abstract
In the present study we establish the use of the proton induced X-ray emission (PIXE) technique coupled with Rutherford backscattering as a sensitive technique for air-pollution monitoring. Several elements such as Al, Si, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, and As were detected in the ppm level of concentration. Comparisons show the advantages of micro-PIXE over scanning microscope-based energy-dispersive X-ray spectrometry (SEM-EDX) and energy-dispersive X-ray fluorescence spectrometry (EDXRF). © 2014 Springer Science+Business Media New York.
About the journal
JournalJournal of Applied Spectroscopy
PublisherKluwer/Plenum Publishers
ISSN0021-9037