The authors have carried out the large-signal characterization of silicon-based double-drift region (DDR) impact avalanche transit time (IMPATT) devices designed to operate up to 0.5 THz using a large-signal simulation method developed by the authors based on non-sinusoidal voltage excitation. The effect of band-to-band tunneling as well as parasitic series resistance on the large-signal properties of DDR Si IMPATTs have also been studied at different mm-wave and THz frequencies. Large-signal simulation results show that DDR Si IMPATT is capable of delivering peak RF power of 633.69 mW with 7.95% conversion efficiency at 94 GHz for 50% voltage modulation, whereas peak RF power output and efficiency fall to 81.08 mW and 2.01% respectively at 0.5 THz for same voltage modulation. The simulation results are compared with the experimental results and are found to be in close agreement. © 2013 Chinese Institute of Electronics.

A ACHARYYA

S BANERJEE

J P BANERJEE

University of Calcutta (informally known as Calcutta University or CU) is a collegiate public state university located in Kolkata, West Bengal, India.&nbsp;Within India it is recognized as a &quot;Five-Star University&quot; and accredited &quot;A&quot; Grade by National Assessment and Accreditation Council.

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It was established on 24 January 1857, and was one of the first institutions in Asia to be established as a multidisciplinary and Western-style university. Its alumni and faculty include several heads of state, heads of government, social reformers, prominent artists, only academy award winner and Dirac medal winner in India, many Fellows of the Royal Society and five Nobel laureates as of 2019 which is highest in South Asia.

University Of Calcutta

Large-signal characterization of DDR silicon IMPATTs operating in millimeter-wave and terahertz regime

Journal of Semiconductors

The authors have developed a quantum corrected drift-diffusion model for impact avalanche transit time (IMPATT) devices by coupling the density gradient model with the classical drift-diffusion model. A large-signal simulation technique has been developed by incorporating the quantum potentials in the current density equations for the analysis of double-drift region IMPATT devices based on different semiconductors such as Wurtzite–GaN, InP, type-IIb diamond (C), 4H–SiC and Si deigned to operate at different millimeter-wave (mm-wave) and terahertz (THz) frequencies. It is observed that, the RF power output and DC to RF conversion efficiency of the devices operating at higher mm-wave ($$>$$>140 GHz) and THz frequencies reduce due to the incorporation of quantum corrections in the model; but the effect of quantum corrections are negligible for the devices operating at lower mm-wave frequencies ($$\le $$≤140 GHz). © 2014, Springer Science+Business Media New York.

Journal of Computational Electronics

Quantum corrected drift-diffusion model for terahertz IMPATTs based on different semiconductors

An attempt is made in this paper to explore the potentiality of semiconducting type-IIb diamond as the base material of double-drift region (DDR) impact avalanche transit time (IMPATT) devices operating at both millimetre-wave (mm-wave) and terahertz (THz) frequencies. A rigorous large-signal (L-S) simulation based on the non-sinusoidal voltage excitation (NSVE) model developed earlier by the authors is used in this study. At first, a simulation study based on avalanche response time reveals that the upper cut-off frequency for DDR diamond IMPATTs is 1.5 THz, while the same for conventional DDR Si IMPATTs is much smaller, i.e. 0.5 THz. The L-S simulation results show that the DDR diamond IMPATT device delivers a peak RF power of 7.79 W with an 18.17% conversion efficiency at 94 GHz; while at 1.5 THz, the peak power output and conversion efficiency decrease to 6.19 mW and 8.17% respectively, taking 50% voltage modulation. A comparative study of DDR IMPATTs based on diamond and Si shows that the former excels over the later as regards high frequency and high power performance at both mm-wave and THz frequency bands. The effect of band to band tunneling on the L-S properties of DDR diamond and Si IMPATTs has also been studied at different mm-wave and THz frequencies. © 2014 Chinese Institute of Electronics.

Potentiality of semiconducting diamond as the base material of millimeter-wave and terahertz IMPATT devices

Quantum correction is necessary on the classical drift-diffusion (CLDD) model to predict the accurate behavior of high frequency performance of ATT devices at frequencies greater than 200 GHz when the active layer of the device shrinks in the range of 150-350 nm. In the present work, a quantum drift-diffusion model for impact avalanche transit time (IMPATT) devices has been developed by incorporating appropriate quantum mechanical corrections based on density-gradient theory which macroscopically takes into account important quantum mechanical effects such as quantum confinement, quantum tunneling, etc. into the CLDD model. Quantum potentials (synonymous as Bohm potentials) have been incorporated in the current density equations as necessary quantum mechanical corrections for the analysis of millimeter-wave (mm-wave) and Terahertz (THz) IMPATT devices. It is observed that the large-signal (L-S) performance of the device is degraded due to the incorporation of quantum corrections into the model when the frequency of operation increases above 200 GHz; while the effect of quantum corrections are negligible for the devices operating at lower mm-wave frequencies. © 2014 Springer Science+Business Media New York.

Quantum drift-diffusion model for IMPATT devices

In this paper the potentiality of impact avalanche transit time (IMPATT) devices based on different semiconductor materials such as GaAs, Si, InP, 4H-SiC and Wurtzite-GaN (Wz-GaN) has been explored for operation at terahertz frequencies. Drift–diffusion model is used to design double-drift region (DDR) IMPATTs based on different materials at millimeter-wave (mm-wave) and terahertz (THz) frequencies. The performance limitations of these devices are studied from the avalanche response times at different mm-wave and THz frequencies. Results show that the upper cut-off frequency limits of GaAs and Si DDR IMPATTs are 220 GHz and 0.5 THz, respectively, whereas the same for InP and 4H-SiC DDR IMPATTs is 1.0 THz. Wz-GaN DDR IMPATTs are found to be excellent candidate for generation of RF power at THz frequencies of the order of 5.0 THz with appreciable DC to RF conversion efficiency. Further, it is observed that up to 1.0 THz, 4H-SiC DDR IMPATTs excel Wz-GaN DDR IMPATTs as regards their RF power outputs. Thus, the wide bandgap semiconductors such as Wz-GaN and 4H-SiC are highly suitable materials for DDR IMPATTs at both mm-wave and THz frequency ranges. © 2012, The Author(s).

Applied Nanoscience (Switzerland)

Prospects of IMPATT devices based on wide bandgap semiconductors as potential terahertz sources

The authors have proposed a complete large-signal (L-S) model to investigate the optical modulation of high frequency properties of double-drift region (DDR) impact avalanche transit time (IMPATT) devices operating at different millimeter-wave and sub-millimeter-wave frequencies. Simulation is carried out based on the proposed model to study the effect of photo-irradiation of different values of incident optical power of different wavelengths from 600-1000 nm on the DC and L-S characteristics of DDR IMPATTs based on Si designed to operate at 94, 140, 220, 300 and 500 GHz. Two different optical illumination configurations such as top mount and flip chip are taken into account for the present study. Results show that the maximum optical tuning of L-S parameters of the device can be achieved for optical illumination of wavelength 700 nm, i.e. near the wavelength corresponding to the responsivity peak of Si in both top mount and flip chip configurations. Further, better photo-sensitivity of top mount structure is observed as compared to its flip chip counterpart. The simulation results are found to be in good agreement with the experimental results reported earlier. Suitable tunable light source information is also suggested to carry out the optical control experiment within the wavelength range under consideration. © 2013 Springer Science+Business Media New York.

Optical control of large-signal properties of millimeter-wave and sub-millimeter-wave DDR Si IMPATTs

Potentiality of Impact Avalanche Transit Time (IMPATT) devices based on different semiconductor materials such as InP, 4H-SiC, and Wurtzite-GaN (Wz-GaN) has been explored for operation at terahertz (THz) frequencies. Drift-diffusion model is used to design double-drift region (DDR) IMPATTs based on above mentioned materials at different millimeter-wave (mm-wave) and THz frequencies and the upper cut-off frequency limits of those devices are obtained from the avalanche response times at those mm-wave and THz frequencies. Results show that the upper cut-off frequency limits of both InP and 4H-SiC DDR IMPATTs are 1.0 THz; whereas, the same is 5.0 THz in Wz-GaN DDR IMPATTs. The Wz-GaN DDR IMPATTs emerge as the most suitable devices for generation of THz frequencies due to their small avalanche response time, high DC to RF conversion ratio, and sufficiently high RF power output at THz frequencies. But, it is observed that up to 1.0 THz, 4H-SiC DDR IMPATTs excel Wz-GaN DDR IMPATTs due to their higher output power densities. Thus, the wide bandgap semiconductors such as Wz-GaN and 4H-SiC are highly suitable materials for DDR IMPATTs at both mm-wave and THz frequency ranges. Copyright © 2013 by the IETE.

IETE Journal of Research

Potentiality of IMPATT devices as terahertz source: An avalanche response time-based approach to determine the upper cut-off frequency limits

A large-signal model and a simulation technique based on non-sinusoidal voltage excitation are used to obtain the electric field snapshots from which the series resistance and related high-frequency properties of a 35 GHz Silicon Single-Drift Region (SDR) Impact Avalanche Transit Time (IMPATT) device have been estimated for different bias current densities. A novel method is proposed in this paper to determine the parasitic series resistance of a millimeter-wave IMPATT device from large-signal electric field snapshots at different phase angles of a full cycle of steady-state oscillation. The method is based on the depletion width modulation of the device under a large-signal condition. The series resistance of the device is also obtained from the large-signal admittance characteristics at threshold frequency. The values of series resistance of a 35 GHz SDR IMPATT diode obtained from the proposed method and the large-signal admittance method are compared with experimentally reported values. The results show that the proposed method provides better and closer agreement with the experimental value. Copyright © Cambridge University Press and the European Microwave Association 2013.

International Journal of Microwave and Wireless Technologies

A proposed simulation technique to study the series resistance and related millimeter-wave properties of Ka-band Si IMPATTs from the electric field snapshots

The authors have developed a large-signal simulation technique extending an in-house small-signal simulation code for analyzing a 94 GHz double-drift region impact avalanche transit time device based on silicon with a non-sinusoidal voltage excitation and studied the effect of junction temperature between 300 and 550 K on the large-signal characteristics of the device for both continuous wave (CW) and pulsed modes of operation. Results show that the large-signal RF power output of the device in both CW and pulsed modes increases with the increase of voltage modulation factor up to 60%, but decreases sharply with further increase of voltage modulation factor for a particular junction temperature; while the same parameter increases with the increase of junction temperature for a particular voltage modulation factor. Heat sinks made of copper and type-IIA diamond are designed to carry out the steady-state and transient thermal analysis of the device operating in CW and pulsed modes respectively. Authors have adopted Olson's method to carry out the transient analysis of the device, which clearly establishes the superiority of type-IIA diamond over copper as the heat sink material of the device from the standpoint of the undesirable effect of frequency chirping due to thermal transients in the pulsed mode. © 2013 Chinese Institute of Electronics.

Journal	Journal of Semiconductors
Publisher	-
ISSN	1674-4926