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Estimation of stress in polycrystalline CuInSe2 films deposited on Mo-coated glass substrates
R. Chakrabarti, A.B. Maity, , D. Bhattacharyya, S. Chaudhuri, A.K. Pal
Published in Wiley-VCH Verlag
1997
Volume: 160
   
Issue: 1
Pages: 67 - 76
Abstract
Stress and strain in polycrystalline thin films of CuInSe2 deposited on soda-lime glass and Mo-coated glass substrates were determined from the optical reflectance spectra by utilizing the broadening of the optical absorption band tail. The contributions of both intrinsic (due to grain boundary and lattice vibrations) and extrinsic stresses (due to thermal mismatch of film and substrate) were considered. It was observed that the films deposited on Mo-coated glass substrates had lower grain size and higher stress (≈3 × 107 Pa) compared to those of the bare glass substrates (≈1.1 × 107 Pa). This process of estimation of mechanical properties of thin films from optical measurements on both absorbing (Mo/glass) and non-absorbing (glass) substrates appears to be very attractive due to its non-destructive nature. The defect state density (Qt) at the grain boundary region along with the internal built-in average electric field (Fav) were determined with the variation of the Cu/In ratio in the films, deposited on glass and Mo-coated glass substrates. It was observed that both Qt and Fav were higher for Cu/In < 1.0 and decreased as the stoichiometric composition was approached.
About the journal
JournalData powered by TypesetPhysica Status Solidi (A) Applied Research
PublisherData powered by TypesetWiley-VCH Verlag
ISSN00318965