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Effect of Finite Current Multiplication Factor in the Avalanche Zone on the High-Frequency Noise Properties of Read Diodes
B B PAL, B SOM, S K ROY
Published in -
1976
Volume: 64
   
Issue: 8
Pages: 1252 - 1254
Abstract
The high-frequency noise properties of a Read diode, whose current multiplication factor in the avalanche zone can be controlled and is finite, has been analyzed. The analysis indicates that the open-circuit noise voltage and the noise figure of the diode are reduced with the lowering of die current multiplication factor. It is also found that the open-circuit noise voltage exhibits a finite peak at the avalanche frequency for finite but large values of M which, however, disappears at lower values of M(<100). Copyright © 1976 by The Institute Of Electrical and Electronics Engineers, Inc.
About the journal
JournalProceedings of the IEEE
Publisher-
ISSN0018-9219