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Design of exclusive or sum-of-products (ESP) logic arrays with universal tests for detecting stuck-at and bridging faults
B B BHATTACHARYA, B GUPTA, S SARKAR, A K CHOUDHURY
Published in -
1984
Volume: 11
   
Issue: 1
Pages: 67 - 78
Abstract
The detection problem of bridging faults in AND-EXOR arrays is considered in this paper in a new framework. These AND-EXOR arrays are different from the arrays based on the so-called Reed-Muller canonic (RMC) expansion of functions. The multiple stuck-at fault detection test set in such arrays as already derived by Pradhan[1] has been utilized to detect bridging faults. One most important advantage of this test set is that it is independent of the function realized and it has a simple algebraic structure and hence can be generated easily. As this conventional test set is insufficient to detect all bridging faults, we propose a technique of augmenting the network with some additional observation points which take care of otherwise undetectable bridging faults. © 1984.
About the journal
JournalComputers and Electrical Engineering
Publisher-
ISSN0045-7906