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Amendment of cavity perturbation method for measuring dielectric properties of medium loss sample at microwave frequencies
P BANERJEE, G GHOSH,
Published in NATL INST OPTOELECTRONICS
2012
Volume: 6
   
Issue: 43591
Pages: 623 - 626
Abstract
The conventional cavity perturbation method of placing the sample on the broad wall of a rectangular cavity resonator is altered by placing the sample on a narrow wall of the cavity and an analytical formula is proposed for measuring the dielectric properties of medium loss materials at microwave frequencies. Advantages and limitations of the analytical technique over earlier approaches of calibration techniques are also presented.
About the journal
JournalOptoelectronics and Advanced Materials, Rapid Communications
PublisherNATL INST OPTOELECTRONICS
ISSN1842-6573